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1、厦门大学软件学院-毕业论文本科毕业论文(毕业设计)题 目：基于MARCH算法的内存异常检测研究 -MARCH-TB及MARCH-Y算法分析 姓 名：学 院：软件学院系：软件工程专 业：软件工程年 级： 学 号： 指导教师（校内）： 职称： 年 月I摘 要在当今工业，由于生产技术和产品设计提高等的原因，每个晶体管的制造成本呈持续下降的趋势，而每个晶体管的测试成本却基本保持不变。因而测试成本在快速追上制造成本，并且将很快超过其制造成本。原因很简单，因为先进的测试设备的价格非常昂贵使得测试成本居高不下。因此，对测试方法和测试算法的改进就成了重中之重。本文从研究系统芯片可测试性设计理论出发，从对可测试
2、性设计的内建自测试方法的研究中找寻对内存测试方法的有益论点。然后，分析存储器和存储单元的故障类型，思考他们的特点，进而比较各种当前较常用的算法，详细分析MARCH算法的特性，探寻对MARCH算法的改进。在文章的下半部份以便于学者及研究人员对MARCH算法的研究和改进为目标，分析设计了一个以MARCH算法为基础的内存检测系统，并对系统的重点和难点进行了详细分析。本文包括了对内存故障模型和内存测试算法的分析，并主要对所设计的Windows和DOS版内存检测系统进行介绍，分别列出了其详细设计，和运行效果，并就各种MARCH算法所提供的测试向量进行了分析比较。关键词：MARCH算法 存储器 内存异常检
3、测 BISTAbstractIn todays industry, due to production of technology and improve of product design, and other reasons, the manufacturing cost of transistor continues down, but the basic cost of the test of transistor remains unchanged. Thus the tests cost is rapidly catching up with the manufacturing c
4、ost, and will exceed its manufacturing costs. The reason is very simple, because of the high price of advanced test equipment makes the cost high. Therefore, the test methods and test algorithm has become the top priority of improving.This article start from can be tested on system-on-chip design th
5、eory, from the design to test the built-in self-testing methods in the study of memory testing methods to find a useful argument. Then, memory and storage unit of the fault type, thinking their characteristics and then compare the more commonly used method, detailed analysis of the characteristics o
6、f MARCH algorithm, to explore the MARCH algorithm improvements. In the article, in the second half to scholars and researchers in MARCH to study and improve the algorithm as the goal, the design of a MARCH algorithm-based detection system memory and system of priorities and carried out a detailed an
7、alysis of difficult.In this paper, including the fault of memory and memory test model algorithm analysis and design of the main Windows and DOS version of memory test system, a breakdown of its detailed design and operational effectiveness, and analyse the difficulties in achieving, to resolve.Keyw
8、ords: MARCH Algorithm ，Memory， Memory Anomaly Detection ，BIST目 录摘要II引 言1第一章 存储器测试的发展21.1存储器测试发展动态21.2 BIST的测试方法4第二章 存储器的故障模型82.1 存储器故障分类82.2存储单元的简化功能故障92.3存储器故障诊断算法分析92.3.1 Checkerboard算法（棋盘法）102.3.2 Gallop算法（奔跳法）102.3.3 MARCH算法（进行法）112.3.4基于棋盘算法的改进11第三章MARCH算法详细叙述153.1 ATS和改进的ATS算法(MATS)153.1.1 MAT
9、S算法153.1.2 MAT S+算法153.1.3 MATS+算法163.2 MARCH A和MARCH B算法163.2.1 MARCH A算法173.2.2 MARCH B算法173.3 MARCH C算法183.3.1 MARCH C算法183.3.2 MARCH C+算法193.3.3 MARCH C-算法203.4其它MARCH算法203.4.1 MARCH X算法203.4.2 MARCH-TBA算法213.4.3 MARCH SS算法223.5小结23第四章MARCH-TB和MARCH-Y算法274.1 MARCH TB算法思想及内容274.1.1 MARCH-TB算法的故障检
10、测能力284.1.2对 SAF故障分析304.1.3 对TF 分析304.1.4 对CF故障分析314.1.5对DRF故障分析334.2 MARCH-Y算法334.2.1 MARCH-Y算法及其检测能力334.2.2 对SAF故障344.2.3对TF故障354.2.4 对CFin故障35第五章 总结37致谢38参考文献39ContentsABSTRACTIIINTRODUCTION1CHAPTER I OF THE DEVELOPMENT OF MEMORY TEST21.1 Memory test developments21.2 BIST testing methods4CHAPTER I
11、I MEMORY FAULT MODEL82.1 Memory fault classification82.2 Storage units feature a simplified fault92.3 Memory fault diagnosis algorithm of92.3.1 Checkerboard algorithm (The board)102.3.2 Gallop algorithm (Ben jump)102.3.3 MARCH algorithm (a)112.3.4 based on the chessboard of the algorithm to improve1
12、1CHAPTER III MARCH ALGORITHM DESCRIBED IN DETAIL153.1 ATS ATS and improve the algorithm (MATS)153.1.1 MATS algorithm153.1.2 MAT S + algorithm153.1.3 MATS + + algorithm163.2 MARCH A algorithm and MARCH B163.2.1 MARCH A algorithm173.2.2 MARCH B algorithm173.3 MARCH C algorithm183.3.1 MARCH C algorithm
13、183.3.2 MARCH C + algorithm193.3.3 MARCH C-algorithms203.4 Algorithm other MARCH203.4.1 MARCH X algorithm203.4.2 MARCH-TBA algorithm213.4.3 MARCH SS algorithm223.5 Summary23CHAPTER IV MARCH-TB ALGORITHM DETAILING274.1 MARCH TB algorithm thinking and content of274.1.1MARCH-TB capacity fault detection
14、 algorithm284.1.2 Failure Analysis of the SAF304.1.3 Failure Analysis of the TF304.1.4 Failure Analysis of the CF314.1.5 Failure Analysis of the DRF334.2 MARCH-Y algorithm334.2.1 MARCH-Y algorithm and its ability to detect334.2.2 Failure Analysis to SAF344.2.3 Failure Analysis to TF354.2.4 Failure A
15、nalysis to CFin35CHAPTER V CONCLUDED37THANKS38REFERENCES39引 言随着深亚微米VLSI技术的发展，大量的不同厂家的电路设计或核集成到一个芯片上。存储器密度的增长使存储器的测试面临着更大的挑战。嵌入式RAM存储器是最难测试的电路，因为存储器的测试通常需要大量的测试模式来激活存储器并将存储器的单元内容读出来与标准值进行比较。在可以接受的测试费用和测试时间的限制下，准确的故障模型和有效的测试算法是至关重要的。而为了保证测试时间和故障覆盖率，测试的好坏大大的依赖于所选的功能故障模型。随着集成电路设计方法与工艺技术的不断进步，集成电路的可测性己经成为提高产品可靠性和成品率的一个不
