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1、可靠性光盘的目录CD1/Application Notes for Solid Tantalum Capacitors/Capacitor Lifetime Calculation 200302/LIFETME CALCULATION FORMULA OF ALUMINUM ELECTROLYTIC CAPACITORS/Guide to Use Aluminum Electrolytic Capacitors/Aluminium Electrolytic Capacitors/ELECTRICAL CHARACTERISTICS AND EXPLANATION OF TERMS/电解电容的应
2、用/电容寿命计算方法：/電容衝擊試驗報告/電容衝擊試驗報告/壽命計算公式-max/A11空调系统失效模式分析/FMEA(sumida)/FMEA/FMEA手册/PFMEA案例/系统FMEA/Accelerated Thermal Cycling and Failure Mechanisms/Accelerated_Standards_Transition_Plan_Approved_by_Board_06_04/Accelerated stress testing/the enviromental stress screen handbook/Pre halt analysis/谈加速寿命试验
3、/2003 CARTS Derating differences Ta-KO-AO/sony ss-00259 handbook/ADI Reliability Handbook/stress test qualification for discrete semiconductors/An Overview of Weibull Analysis/balloons reliability analysis/An Improved SPICE Capacitor Model/CONSEQUENCES AND CATEGORIES OF SRAM FPGA/COST ANALYSIS/EEE P
4、ARTS DERATING/Stochastic Aging and Dependence for Reliability/Fault tree construction/final drive and axle fluid requirements/Fish Embryo Analysis/FLOTHERM V4.1 Introductory /Generalized Step Stress Accelerated Life Model/HALT & HASS/IBM ASIC Products Application Note/IEC 60950/Improving the Perform
5、ance of Your Root Cause Analysis (RCA) Program/The Application of Accelerated Testing Methods and Theory Accelerated Testing Methods and Theory HALT-HASS/Life Testing and Reliability Predictions for Electromechanical Relays/MAXIM reliability report/TESTING FOR RELIABILITY IN SPACE SYSTEMS/MTBF Instr
6、uction Guide/MTBF 計算方法概論/MODELING AND SIMULATION OF RELIABILITY & MAINTAINABILITY PARAMETERS FOR REUSABLE LAUNCH VEHICLES USING DESIGN OF EXPERIMENTS/on precendence life testing/MEASUREMENT PRACTICES FOR RELIABILITY AND POWER QUALITY/POST PROGRAMMING BURN IN (PPBI) FOR RT54SX-S AND A54SX-A ACTEL FPG
7、AS/Profile_PAL_draft_v1_3b/MINI DIN Series ConnectorProduct Specification(For Internal Use)/ USB Series Connector Product Specification (For Internal Use)/THE RETAIL ELECTRIC COMPETITION TASK FORCE/Reliability as a Systems Engineering Investment Not Just a Cost/Reliability Design Technology for Powe
8、r Semiconductor Modules/Reliability Programs/Reliability Engineering Principles/Reliability Testing and Data Analysis of High-Density PackagesLead-Free Solder Joints/Dynamic reliability and risk assessment of the accident localization system of the Ignalina NPP RBMK-1500 reactor/Semiconductor Device
9、 Reliability Failure Models/Software Reliability Handbook Chaper11/SONY SS-00259-1第四版(英日)/SONY00254-5-R4/Standard Linear IC reliability/Stress test Qualification for Integrated Circuits/System Availability Modelling/The Challenge of Supporting Aging Naval Weapon Systems Aging Naval Weapon Systems/Us
10、ing Telcordia Calculation Methods to Adjust Failure Rates/Warranty Cost An Introduction/wetting balance theory/包装试验方法/产品的热设计方法无图/电子产品可靠性设计及预计/环境应力筛选（ESS）/基于模糊优化的零部件疲劳寿命可靠性分析/结构可靠性分析的区间方法/可靠性基本计算/可靠性预计方法及一点思考/可信性工程/零库存系统/潜在失效模式和效果分析/潜在失效模式和效果分析2/浅析2xkW汽车电站双机组对可靠性的影响/塑膠產品外觀印刷品質檢驗標準/维护和可靠性/系统可靠性理论与工程实践
11、/以可靠性为中心的维护保养/主板可靠性测试标准流程/半导体集成电路的可靠性设计/产品全寿命周期管理中的加速环境试验技术/当代质量观与可靠性/电子元器件的可靠性安装/电子元器件的运输、储存和测量/电子元器件的质量与可靠性军用标准体系/电子专用设备的可靠性试验/电阻器与电位器的可靠性/二十世纪留给二十一世纪可靠性工程热点问题/防止可靠性设计分析中的若干片面性/非工作期微电路的可靠性及其预计/高加速寿命试验（HALT）与高加速应力筛选（HASS）/功率模块可靠性/国外可靠性工程发展/国外直升机可靠性 维修性和保障性发展综述/合理选择继电器提高家电可靠性/基于环境的大型结构物模态试验/几种电子元器件长
12、期储存的失效模式和失效机理/可靠度保證-工程與管理技術之應用/可靠性工作主要内容/可靠性管理/可靠性试验的编码故障树分析/可靠性预计和分配的作用原理及预期效益/可靠性预计模型的参数敏感度分析/可靠性增长试验的体会/美国可靠性分析中心(RAC)的可靠性培训课程/美国可靠性强化试验技术发展点评/某平显可靠性鉴定试验及思考/失效率/失效率曲线的分析与新修正模型的建立/寿命数据分析理论参考英文版/台式电脑电子系统的驱动器可靠性评估/微电路的质量、可靠性等级/微电路降额设计指南/未来电子系统封装可靠性面临的困难/一种威布尔寿命分布模型/一种威布尔寿命分布模型/元件可靠性 EMC/电磁屏蔽材料设计者指南/
13、文章集合（共50篇）/如何尽量降低PCB板上的地噪声/防雷器在电源系统中的应用/ 运算放大器的选择方法 /新一代数字IC/电子设备、分系统和系统的电磁兼容设计中的可靠性考虑/射频屏蔽室屏蔽效能的测试技术/磁屏蔽理论和实践/局域网的电磁能量泄漏/开关电源滤波器的正确选择与使用/如何选择屏蔽外壳/ESD/Electronic Design/Electronic System Design/EMC design technology/High-Speed Board Design Techniques/集肤效应/Bus LVDS SER/DES FAQs/ACPI Component Archite
14、cture Programmer Reference/A critique of the EMC Directive/Abatement of Static Electricity/An EMC Directive for the Next Century/COMPLIANCE SYSTEMS CORPORATION app_note_EN61000-4-5/Australian EMC Regulation and Routes to Compliance/Building a Bridge Between Product Safety and EMC/Commercial Practices Standard Set to Replace MIL-STD 1686/Developments in Electrical Safety Testing/Electrical Safety Testing/Electromagnetic Compatibility/EMC & EMI of computer/What to look for in an emc amplifiers/EMC annata select/What to look for in an emc antennas/EMC base 基本概
