cmos图像传感器资料

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1、 Panavision Imaging LLC 2004- 2009 All rights reserved. PDS0004 REV J 04/14/09 Subject to change without notice. Page 1 of 13 High Performance Linear Image Sensors ELIS-1024 IMAGER The Panavision Imaging ELIS is a high performance linear image sensor designed to replace CCDs in a wide variety of app

2、lications, including: Edge Detection Contact Imaging Bar Code Reading Finger Printing Encoding and Positioning Text Scanning Description The ELIS-1024 Linear Image Sensor consists of an array of high performance, low dark current photo-diode pixels. The sensor features sample and hold capability, se

3、lectable resolution and advanced power management. The device can operate at voltages as low as 2.8V making it ideal for portable applications. A key feature over traditional CCD technology is that the device can be read and reread Non-Destructively, allowing the user to maximize signal to noise and

4、 dynamic range. Internal logic automatically reduces power consumption when lower resolution settings are selected. A low power standby mode is also available to reduce system power consumption when the imager is not in use. Available in a low cost SMT package as well as a high performance dual inli

5、ne ceramic package. Key Features Low Cost Single Voltage Operation, Wide Operating Range Selectable Resolutions of 1024, 512, 256 and 128 pixels Intelligent Power Management and Low-Power Standby Mode Sample and Hold Full Frame Shutter and Dynamic Pixel Reset (DPR) Modes High Sensitivity High Signal

6、 to Noise Non-Destructive Read Capable, extremely low noise capable via signal averaging 1.0 kHz to 30.0 MHz Operation Very Low Dark Current Completely Integrated Timing and Control Replaces Entire CCD Systems, Not Just the Sensor P/N: ELIS-1024A-LG 16-pin LCC package P/N: ELIS-1024A-D-ES 16-pin cer

7、amic DIP package P/N: ELIS-1024A-CP-ES CSP package (BGA) T E L : 1 5 8 0 1 3 6 2 8 8 7 0 1 0 - 6 2 5 7 7 5 8 0 h e s i r Panavision Imaging LLC 2004- 2009 All rights reserved. PDS0004 REV J 04/14/09 Subject to change without notice. Page 2 of 13 FUNCTIONAL BLOCK DIAGAM PIN DESCRIPTION 16 Pin DIP and

8、 16 LCC packages PIN LCC ELIS-1024A-LG Leadless Chip Carrier (LCC). ELIS-1024A-D-LG-ES 16 pin ceramic dual inline package (DIP) without window. ELIS-1024A-CP-ES Chip Scale Package (BGA) ELIS-1024A-G Known Good die on wafer Note: ES designates Engineering Sample Grade Contact Panavision Imaging, LLC

9、or your local authorized representative for pricing and availability. Characterization Criteria Characterization measurements are guaranteed by design and are not tested for production parts. Unless otherwise specified, the measurements described herein are characterization measurements. Pixel Clock

10、 Frequency The pixel clock frequency is the frequency at which adjacent pixels can be reliably read. Full Well Full well (or Saturation Exposure) is the maximum number of photon-generated and/or dark current- generated electrons a pixel can hold. Full well is based on the capacitance of the pixel at

11、 a given bias. Full well is determined by measuring the capacitance of all pixels for the operational bias. In reality, the pixel analog circuitry will limit the signal swing on the pixel, so full well is defined as the number of electrons that will bring the output to the specified saturation volta

12、ge. Quantum Efficiency Quantum Efficiency is a measurement of the pixel ability to capture photon-generated charge as a function of wavelength. This is measured at 10nm increments over the wavelength range of the sensor typically over the range 300 to 1100 nm. Measurements are taken using a stable l

13、ight source that is filtered using a monochromator. The exiting light from the monochromator is collimated to provide a uniform flux that overfills a portion of the sensor area. The flux at a given wavelength is measured using a calibrated radiometer and then the device under test is substituted and

14、 its response measured. Linearity Linearity is an equal corresponding output signal of the sensor for a given amount of photons incident on the pixel active area. Linearity is measured by plotting the imager transfer function from dark to saturation and fitting a best fit straight line from 5% to 75

15、% of saturation. The maximum peak-peak deviation of the output voltage from the best fit straight line is computed (Epp) over the fitting range. Linearity (L) is then computed as shown below where VFS is the full- scale voltage swing from dark to saturation measured with sensor gain at 0.0 dB. %1001= FSppVEL Average Dark Offset The dark offset is the voltage proportional to the accumulated electrons for a given integration period, that were not photon generate

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