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1、Testing Training Brochure集成电路专业测试技术培训课程介绍Table of ContentIntroductionTraining by Teradyne China TAG 泰瑞达测试应用部技能发展培训TeradyneTeradyne, Inc. is the worlds largest supplier of automatic test equipment and is also a leading provider of high performance interconnection systems and electronic manufacturing
2、services. Teradyne was founded in 1960 and became a publicly owned company in 1970. Its headquarters are in Boston, Massachusetts. 泰瑞达公司是全球最大的自动测试设备供应商，也是引领高性能互连系统和电子制造服务供应商。泰瑞达成立于1960年，在1970成为上市公司。公司总部设在马萨诸塞州的波士顿。Teradyne is a leading worldwide supplier of automatic test equipment for logic, RF, an
3、alog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as cells in system-on-a-chip (SOC) devices. ICs tested by Teradyne are used in computing, communications, consumer,
4、 automotive, identification, and internet applications.泰瑞达是引领全球逻辑、RF、模拟、电源、混合信号、存储器技术的自动测试设备供应商。我们为集成电路开发人员和制造商提供测试解决方案，无论独立封装或整合成片上系统（SOC）的器件。经由泰瑞达测试的集成电路广泛应用于计算机、通讯、消费电子、汽车电子、身份识别和互联网应用。Our semiconductor test system customers include electronic component manufacturers and fabless subcontractors to
5、 the semiconductor industry. To find out more about Teradyne, please visit our website at http:/我们的半导体测试系统的客户包括电子元件制造商、设计厂商等半导体业界诸多公司。想要了解更多的信息，请浏览我们的网站：http:/Test Applications Group (TAG) Recognized as the worlds leading professional services organization for semiconductor device testers, Teradynes
6、 Test Applications Group (TAG) delivers Total Test Solutions worldwide. From design to high volume production, TAGs applications engineers are specialists in linear, mixed-signal, logic and memory testing devices. This value-added support includes test cell integration, test program and hardware dev
7、elopment, tools for test productivity and skill development training. Teradyne 测试应用部门是全球领先的为半导体器件测试人员提供服务的专业机构，为半导体业界客户提供全套的测试解决方案。从设计到量产，TAG的应用工程师都是线性、混合信号、逻辑电路和存储器测试方面的专家。这种有附加值的技术支持包括测试单元的集成、测试程序与硬件的开发、量产测试的工具和技能发展培训。For years, Teradynes customers have benefited from the device test expertise of
8、Test Applications Group (TAG) engineers. This expertise, acknowledged by TAGs reputation as the leading professional services organization for semiconductor device testers, is continuously enhanced through up-to-date technical training and skill development courses, all of which are available for yo
9、ur engineers and technicians. Deployed globally in regional Technical Centers, TAGs technical training and skill development courses can also be delivered on site by TAG-certified instructors多年来，Teradyne的客户已经得益于TAG工程师的测试经验。这些专业的测试工程师，作为公认的半导体器件测试提供服务的专业机构，不断致力于发展与日新月异的技术相承附的专业技术培训和技能培养课程，从事测试行业的的工程师
10、和技术人员能够从这些课程中受益。除了在遍布全球的Teradyne培训中心提供培训，TAG认证的讲师也可以现场为您提供专业技术培训和技能发展课程。人人都可以用测试设备和计算机做联系标准的培训课程普通话教学经泰瑞达授权的培训中心易懂的培训教材经验丰富的讲师Experienced Instructors: Lee(LiGuo ) ZhangEXPERIENCESMIC, Shanghai, China 中芯国际集成电路制造（上海）有限公司07/01 PresentDesign Service Technical Director 设计服务技术经理EXPERIENCESIEMENS Microelec
11、tronics., Munich, Germany (Delegation)SIEMENS Microelectronics., Dresden Fab., Germany 德国慕尼黑西门子微电子（授权） 德国德累斯顿 Fab西门子微电子05/97 07/01 Sr. Product/Testing Development Manager 产品/测试开发部资深经理.EXPERIENCELATTICE SEMICONDUCTOR CORP., California, USA 美国加利福尼亚Lattice半导体公司 09/94 05/97 Manager/Senior Product & Test
12、 Development Engineer 产品/测试开发补资深经理EXPERIENCEATMEL CORPORATION, California, USA 美国加利福尼亚ATMEL 有限公司 08/91 09/94 Sr. Product and Test Engineer in Microcontroller Group. 微控制器产品/测试资深工程师EXPERIENCEDEINIPPON MANUFACTURING PRINTER CO., JAPAN06/85 03/89 Circuit and System Design EngineerTraining Course Catalog
13、Training Course Catalog课程目录v IC testing KnowledgeDigital Signal IC测试技术基础数字信号部分v Digital Signal Testing knowledge（Level one） 数字信号测试技术基础（初级篇）v Digital Signal Testing knowledge（Level two） 数字信号测试技术基础（高级篇）v IC testing KnowledgeMixed Signal IC测试技术基础混合信号部分v Mixed Signal Testing knowledge（Level one） 混合信号测试技术基础（初级篇）v Mixed Signal Testing knowledge （Level two）混合信号测试技术基础（高级篇）v IC testing KnowledgeMemory Testing IC测试技术基础存储器测试技术部分v Memory Testing knowledge 存储器测试技术基础v IC test
