世界半导体生产机台安全设计验收标准

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1、世界半导体生产机台安全设计验收标准 精品汇编资料GlobalSemiconductorSafetyServices,LLC SEMIS2-93AProductSafetyAssessmentFinalReport世界半导体生产机台安全设计验收标准AppliedMaterialsChemicalMechanicalPolishingSystemModel:MirraTrakCMP 工艺应用材料June19,1998Preparedfor:AppliedMaterials 3111CoronadoDrive SantaClara,CA95054Preparedby:GlobalSemiconduc

2、torSafetyServices,LLC1313GenevaDriveSunnyvale,CA94089GS3JobNo.980029GS3DocumentNo.980029F2Client-Confidential保密合约engineers.TheinformationwasalTheinformationusedtopreparethisreportwasbasedon interviewswithAppliedMaterials sobasedoninspectionsoftheChemicalMechanicalPolishingSystem,Model:MirraTrak.This

3、informationwasgatheredover theperiodbetweenFebruary2,1998andFebruary4,1998,andduringare-inspectionofthesystemonJune3,1998.Apreliminar yassessmentofthesystemwasalsoperformedonSeptember25,1996throughSeptember26,1996andtheresultsofthisevaluat ionwerealsoused.Allobservationsandrecommendationsarebasedonc

4、onditionsanddescriptionsoftheChemicalMechanic alPolishingSystem,Model:MirraTrak,duringthetimeofdatacollectionanduponinformationmadeavailabletoGlobalSemi conductorSafetyServices.ThisreportssignificanceissubjecttotheadequacyandrepresentativecharacteristicsoftheChemi calMechanicalPolishingSystem,Model:

5、MirraTrak,andtothecomprehensivenessofthetests,examinationsand/orsurveys made.ReferencetoGlobalSemiconductorSafetyServices,includingreproductionofGlobalSemiconductorSafetyServices cemark,inpromotionalmaterials,ispermittedonlywithGlobalSemiconductorSafetyServices expresswrittenconsent.Theserviceperfor

6、medhasbeenconductedinaccordancewiththestandardscurrentlyacceptedinourprofession,andatthehigh levelofskillandcareexercisedbyGlobalSemiconductorSafetyServices staff.Lastly,thisreporthasbeenpreparedasaClient-Confidentialdocument,intendedfortheexclusiveuseofAppliedMaterialsand forthepurposeofdocumentati

7、ontoSEMIS2-93A.Therefore,nooutsidedistributionwilloccurunlesswrittenauthorizationis providedbytheclient.TABLEOFCONTENTS目录SectionPageNo.Section2.0SCOPE(范围)Section3.0SYSTEMDESCRIPTION(系统描述)Section4.0ASSESSMENT&TESTINGMETHODOLOGIES(试验方法)Section5.0SAFETYASSESSMENT(安全评估)5.1 PURPOSE(目的)5.25 COPE(适用范围)5.35

8、 AFETYPHILOSOPHY(安全体系)5.36 ENERALGUIDELINES(指导方针)5.55 AFETY-RELATEDINTERLOCKS(安全互锁)5.56 HEMICALS(化学品)5.7IONIZINGRADIATION5.57 ON-IONIZINGRADIATION5.58 OISE(噪音)5.59 VENTILATIONANDEXHAUST( 通风与排凤)5.60 ELECTRICAL5.12EMERGENCYSHUTDOWN(紧急停机)5.13HEATEDCHEMICALBATHS5.14HUMANFACTORSENGINEERING5.15ROBOTICAUTO

9、MATION5.16 HAZARDWARNING(危险警告)5.17 EARTHQUAKEPROTECTION(地震警告)5.18 DOCUMENTATION( 文件)5.19 FIREPROTECTION(消防保护)5.20 ENVIRONMENTALGUIDELINES(环境方针)Section6.0RECOMMENDATIONS Section7.0-ILLUSTRATIONS ILLUSTRATION1-MirraTrakSystemLayoutATTACHMENTONE-SURFACELEAKAGECURRENTTEST(泄漏测试)ATTACHMENTTWO-GROUNDINGRES

10、ISTANCETEST( 接地电阻测试)ATTACHMENTTHREE-VERIFICATIONOFEMO(紧急按钮确认)ATTACHMENTFOUR-SOUNDPRESSURELEVELSURVEY(声压测试)ATTACHMENTFIVE-ERGONOMICCHECKLIST(人体功力检查表)ATTACHMENTSIX-MANUALHANDLINGLIFTANALYSIS(手动操作分析)ATTACHMENTSEVEN- 摘 HAT- IF? ” HAZARDANALYSIS(危险分析)ATTACHMENTEIGHT-SEMIS10-1296RISKASSESSMENTGUIDELINEMET

11、HODOLOGYCONCLUSIONSectionl.OMANAGEMENTSUMMARYAfollow- upsafetyassessmentoftheAppliedMaterials ChemicalMechanicalPolishingSystem,Model:MirraTrak(hereafterreferredtoastheMirraTrak),wasperformedfromFebruary2,1998throughFebruary4,1998.Afurtherre-inspectionofthes ystemwasperformedonJune3,1998.Apreliminar

12、yevaluationofthesystemwasalsoperformedonSeptember25,1996throug hSeptember26,1996,andtheresultsofthisevaluationwerealsoutilizedinthisreport.Notethatthisreportcoversonlytheconce rnsraisedbyintegratingthreeseparatesystems,theAppliedMaterialsFABSandMirraCMP,andtheOnTrakSynergyIntegra, whichtogetherformt

13、heMirraTraksystem.Forfurtherinformationconcerningtheindividualcomponents,referencetheindiv idualSEMIS2-93Areportsfortheseunits.(GS 3ReportNo.970668TF,datedJanuary30,1998fortheFABSsystem;GS 3Repor tNo.7-0100,datedSeptember2,1997fortheMirraCMPsystem;andGS 3ReportNo.980094F,fortheOnTrakSynergyIntegra .

14、)ThisreviewwasperformedusingthecriteriaestablishedbytheSemiconductorEquipmentandMaterialsInternationalSafet yGuidelinesforSemiconductorManufacturingEquipment(SEMIS2-93AGuidelines).GS3hasusedtheSEMIS10-1296GuidelineMethodologytoperformaRiskAssessmentofanyIssuesremainingaftertherevie woftheinformation

15、providedbyAppliedMaterials.NotethattheseveritywasrankedbyGS 3;theLikelihood(expectedrateofo ccurrence)wasprovidedbyAppliedMaterials.Itemswhichwererankedonlyasa摄ow” or措light “ riskassessmentcategorymaybeconsideredasacceptablewithoutcorrectiveaction,baseduponcriteriaintheSEMIS10 -1296Guidelines.During

16、thesafetyassessmentofMirraTrak,GS 3identifiedseveralpositiveengineeringdesigns,aswellasseveralissuesthatwi llneedtobeaddressedinordertoachievefullcompliancewithSEMIS2-93AGuidelines.Thisdescriptionofbothpositiveengi neeringdesignandnon-conformanceissuesarecomprehensivelydescribedinSection5.0ofthisreport.ReferenceSection6.0 forasummaryoftheoutstandingitems.S

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