《agilent_3070_系统介绍》由会员分享，可在线阅读，更多相关《agilent_3070_系统介绍（68页珍藏版）》请在金锄头文库上搜索。
1、Agilent 3070 系统介绍 & 软硬件综述,概要,Part 1 3070系统介绍 Part 2 3070硬件综述 Part 3 3070 软件综述 Part 4 基本的测试原理,Part 1 3070系统介绍,概要 在线测试（ICT）在产线中的位置 ICT基本测试原理 Agilent 3x7y 系列 测试界面 夹具 安全事项 测试程序开发流程 测试工具,在线测试（ICT）在产线中的位置,目标: 尽早的发现制造缺陷 降低PCB板的制造成本,Agilent 3070基本测试原理,Agilent 3070,Agilent 3070基本测试原理,通常是PCB板安装完成后的第一次电学测试 通过检
2、测PCBA上的单个或多个元器件来 验证器件值 检查器件安放位置 确认电路连接 查找PCB制造中的缺陷（短路，开路，错件及零件错位等）,常见制造缺陷,焊点短路,常见制造缺陷,焊点开路,常见制造缺陷,零件安装错位,常见制造缺陷,零件翘起,在线测试功能(Summary),模拟器件测试 上电测试 数字测试 局部的功能测试 精确测试 特殊测试,验证PCB的安装过程 在测试阶段尽快消除明显PCBA上的零件错误 提供最佳的测试方案以取得最大的测试覆盖率,Agilent 3x7y 系列,5184 nodes,2592 nodes,1296 nodes,Agilent 3x7y 系列,Agilent 3x7y
3、系列,3070 3x71-unpower or limited power system 3x72-Process Test System 3x73-Incircuit Test System 3x74-Functional Test System 3x75-Combination Test System 3x79-Telecommunacations Test System,测试界面 夹具,短线夹具的结构,为什么选用短线夹具,安全事项,测试程序开发流程,测试工具,Part 2 3070硬件综述,Outline Agilent 3070 的结构 DUT Power Supply Testhea
4、d Module Designations Cards in Testhead Mother Card Module Control Card ASRU Card Pin Card,Anatomy of Agilent 3070,Anatomy of Agilent 3070 (Cont.),DUT Power Supplies,Testhead,Module Designations,Cards in the Testhead,Mother Card Module Control Card Analog Stimulus-Response Unit (ASRU) Card Pin Cards
5、,Mother Card,提供系统内部板卡的DC电源 Supplies DC power 分配电信号到指定的 Module Control Card 解析地址 Decodes address,Mother Card (Cont.),Multiplexing the ASRU card to pin cards by mother card,Module Control Card,控制实际的测试过程 程序自动读取码 (Autofile Code) 带有8个通用开关 (GP Relay) 必须放在每个module的第 6 槽位 四种类型: Control Card ControlPlus Card
6、 Control XT Card Control XTP,ASRU Card,提供正确的激励信号 Applies the appropriate stimulus 使用测量运算放大器进行电压信号的测量 Makes a voltage measurement with MOA (Measuring Operational Amplifier) 提供直流点信号和波形发生器 Provides DC source and a waveform generator 分配在1号槽 Resides in slot 1 有 A, B, C 三个版本,Pin Card,Hybrid Double Density
7、 Card Hybrid32 Card ChannelPlus Card (No longer available, but still supported) AccessPlus Card AnalogPlus Card Serial Test Plus Card (STC+),Hybrid Double Density Card,Two sides: Side A, Side B MUX ratio (MINT pins : D/R lines): 9:2 16 channels x 9 pins = 144 MINT pins,Hybrid32 Card,Part 3 3070 软件综述
8、,概要 标准测试流程 软件综述 BT-Basic及相关命令 3070操作步骤 测试原理,标准测试流程,软件综述,BT-Basic界面,Status line,Command line,Operating mode,Process ID number,Working space,Special function keys,快捷键,F1 Edit / Command F2 Recall Plus F3 Recall Minus F4 Execute F5 Mark / Second Mark / Clear Mark F6 Test Consultant F7 Pushbutton QSTATS
9、F8 Store Line F9 Insert Line F10 Delete Line F11 Clear Line F12 Clear Display,操作模式,常用BT-Basic命令,cat change change “A” to “BA” changem changem “cd” to “ab” copy to copy to copy over copy over / create dir delete duplicate,常用BT-Basic命令,edit find, findn find “string1”, findn “string2” get, load merge m
10、erge “file1”; “file2”, 5, 6; “file3” move msi, msi$ number scratch save, re-save save “file1”,操作步骤,打开系统的电源 Turn on system 用设定的用户名登陆Log on as hp3070 user 打开 BT-Basic Open BT-Basic 进入到待测板的目录Get to board test directory 输入： testhead power on, testhead is 1 输入： load “testplan” 索紧夹具 Fixture lock 运行程式 Run
11、松开夹具 Fixture unlock 输入： testhead power off, testhead is * 退出BT-Basic 操作 exit 登出 log off 关机 shut down,Testhead 操作命令,testhead power on/off testhead is 1/* fixture lock/unlock faon/faoff exit,Testhead Config file,Testhead Config file (Cont.),The file must be located in the /3070/diagnostics/th1/ direct
12、ory The file must be compiled with the testhead option The testhead may not boot if the config file in incorrect This testhead config file is defined during the initial system installation The testhead config file may not be used as a board level config file,Board Config file,Part 4 基本的测试原理,测试流程回顾 t
13、estplan 模拟测试的基本原理 常用测试选项的介绍 Board Consultant Pushbutton Debug Other Issue,标准测试流程,Analog Test “testplan”,Analog test - concept,Analog test basic,Shorts test,Shorts test (Cont.),Expects shorts Jumpers Closed switches Fuses Small value resistors Etc.,Unexpected shorts High impedance nodes Digital pins
14、Resistors above 10k,Unexpected shorts Low impedance nodes Power nodes Resistors below 10k,Shorts test (Cont.),Pins test,Resistive test,Capacitor or Inductor test,Statement syntax,Capacitor capacitor , Diode diode , Resistor resistor , Jumper jumper ,Measurement options,Board Consultant,Pushbutton De
15、bug,Board Level Debug,Device Level Debug,Device level debug,Analog Debug,Gentle remind,对测试程序进行修改之前进行必要的备份 Do backup before any modification 在修改的部分加入个人的识别编号以便于查询 Do add your ID to the modified parts 在修改的部分加入注释以便于记忆 Do add the comments for modifications,Others,3070 Software Board Graphics Fixture Consultant Diagnostic Test option Data Log Pin Test,Thanks!,More Questions?,Appendix 1,
