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1、69000In-Circuit Test Mode Analysis for the HiQVPro ControllerApplication Note Revision 1.0June 1998PRELIMINARYCopyright NoticeCopyright 1998 Chips and Technologies, Inc., a subsidiary of Intel Corporation, ALL RIGHTS RESERVED.This manual is copyrighted by Chips and Technologies, Inc., a subsidiary o
2、f Intel Corporation. You may not reproduce, transmit, transcribe, store in a retrieval system, or translate into any language or computer language, in any form or by any means - elec- tronic, mechanical, magnetic, optical, chemical, manual, or otherwise - any part of this publication without the exp
3、ress written permission of Chips and Technologies, Inc., a subsidiary of Intel Corporation.Restricted Rights LegendUse, duplication, or disclosure by the Government is subject to restrictions set forth in subparagraph (c)(1)(ii) of the Rights in Technical Data and Computer Software clause at 252.277
4、-7013.Trademark AcknowledgmentCHIPS Logo is a registered trademark of Chips and Technologies, Inc., a subsidiary of Intel Corporation.HiQVideo, is a trademark of Chips and Technologies, Inc., a subsidiary of Intel Corporation.All other trademarks are the property of their respective holders.Disclaim
5、erThis document provides general information for the customer. Chips and Technologies, Inc., a subsidiary of Intel Corporation, reserves the right to modify the information contained herein as necessary and the customer should ensure that it has the most recent revision of the document. CHIPS makes
6、no warranty for the use of its products and bears no responsibility for any errors which may appear in this document. The customer should be on notice that many different parties hold patents on products, components, and processes within the personal computer industry. Customers should ensure that t
7、heir use of the products does not infringe upon any patents. CHIPS respects the patent rights of third parties and shall not participate in direct or indirect patent infringement.Revision HistoryRevisionDateByComment0.15/21/98DJ/lncInitial Release. 1.05/29/98DJ/lncFormatting for useability.?69000 In
8、-Circuit TestingSubject to Change Without NoticeRevision 1.0 6/5/98Table of Contents1.0 Introduction12.0 Operation1Timing Diagram for ICT Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 NAND Gate Chain for
9、 the 69000. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 BGA Pin Diagram for the 69000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10、. . . 33.0 Command File Programs4Sequence of the NAND Gate Chain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 469000 Users Guide1?69000 In-Circuit TestingSubject to Change Without NoticeRevision 1.0 6/5/98In-Circuit Tes
11、t Mode Analysis for the HiQVideo Series Controllers1.0IntroductionThe In-Circuit Test (ICT) Mode for the HiQVideo Series of graphics controllers is a state where all digital pins except RCLK, STNDBY# and the power and ground pins may be tested individually to determine if they are properly connected
12、. This application note provides the details on how the controller works in this mode.2.0Operation1)Pull all pins high except RCLK, STNDBY# and power and ground pins. 2)Pull RESET and RMD4 low. 3)Toggle the RCLK pin twice to high. This will start the test mode as shown in Figure 1, line A. Stop puls
13、ing after the second pulse. 4)Pull RESET and RMD4 high. When the RESET goes low again, you are ready to test the individual pins (see line B in Figure 1). 5)Toggle the pins low one at a time starting with CFG0 (D18) as shown in Figure 1, lines C, D and E in the order given in Table 1. The VSYNC pin
14、will toggle with each pin tested. 6)If VSYNC fails to toggle when any pin is pulled low, the pin is not connected or is somehow defec- tive.For proper operation of the in-circuit test and as a safety precaution, everything not on the ring-down list (Table 1) should be pulled high. 269000 Users Guide
15、?69000 In-Circuit TestingSubject to Change Without NoticeRevision 1.0 6/5/98Figure 1: Timing Diagram for ICT ModelowRCLKRESET#o o o oVSYNCABRMD4TMD1(see list)CFG0highhighCCFG1lowDhighCFG2lowE69000 Users Guide3?69000 In-Circuit TestingSubject to Change Without NoticeRevision 1.0 6/5/98Figure 2: NAND
16、Gate Chain for the 69000VDDRESETCFG0RMA17VSYNC469000 Users Guide?69000 In-Circuit TestingSubject to Change Without NoticeRevision 1.0 6/5/98Figure 3: BGA Pin Diagram for 69000 (Top View)ABCDEFGHJKLMNPRTUVWY20CFG4CFG2N/CN/CN/CN/CN/CN/CN/CN/CRMA17N/CN/CN/CN/CN/CVP1VP6VP10RSVD2019CFG6CFG5CFG1N/CN/CN/CN/CN/CN/CN/CRMA16N/CN/CN/CN/CVP2VP5VP9VP11VP141918N/CCFG7CFG3CFG0N/CN/CN/CN/CN/CN/CN/CN/CN/CN/CVP0VP4VP8VP13VP15VCLK1817RMA2N/CCFG8TMD0N/CN/C
