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1、MIL-STD-202G METHOD 310 CONTACT-CHATTER MONITORING接點抖動監測1. PURPOSE. This test is conducted for the purpose of detecting contact-chatter in electrical and electronic component parts having movable electrical contacts, such as relays, switches, circuit breakers, etc., where it is required that the con
2、tacts do not open or close momentarily, as applicable, for longer than a specified time-duration (see 4.3) under environmental test conditions, such as vibration, shock, or acceleration. This test method provides standard test procedures for monitoring such opening of closed contacts or closing of o
3、pen contacts.1.目的:這測試執行確定在電器和電子零件部份有作切換電器接觸時的接點抖動目的,如繼電器,開關,電流斷路器,等。接觸的地方不能有短暫的斷開或導通。如適用的環境試驗條件下,特定的持續長時間期間(見4.3),如:振動,衝擊或加速。這檢驗方法提供標準測試程序對於監測如”閉合接點打開”或 ”打開接點閉合”兩種測試電路。2. TEST CIRCUITS.2.測試電路2.1 Selection. In this method there are two test-circuits: A (see 3.1), and B (see 3.2). The selection of the
4、 test-circuit depends largely upon the type of electrical contacts to be tested. Test-circuit B is preferred, whenever possible, to avoid contact contamination caused by the formation of carbonaceous deposits on the contacts. The individual specification shall specify the test-circuit and time-durat
5、ion (see 4.3) required in connection with monitoring of shock and vibration tests. The test-circuits listed herein are recommended reference circuits. Any comparable test-circuit which meets the test requirements and the calibration procedures as stated herein , may be used for this test.2.1選擇.這方法有兩
6、個測試電路:A(見3.1),和B(見3.2)。測試電路的選擇取決於主要根據電氣接觸的類型來做測試。測試電路B是首選的, 盡可能, 以避免接觸形成的積炭造成的接觸污染。特定規格應註明衝擊的監測和震動測試時測試電路和持續時間的要求。呈列於此的測試電路為建議的參考電路。任何類似的測試電路都應符合本文中指定的測試要求和校正程序,才能被用作使用測試。2.1.1 Selection of test-circuit A. Test-circuit A is for monitoring test-specimens with a single set of contacts, for the opening
7、 of normally-closed contacts or false closures of normally- opened contacts (see figure 310-1). Test-circuit A should not be specified for specimens whose capability includes low-level or dry-circuit ratings (10 milliamperes or less and 2 volts or less for openings or closings less than 10 microseco
8、nds); since the current through the electrical contacts under test from the test-circuit may cause arcing, thus damaging the contacts.2.1.1 測試電路A的選擇。測試電路A是對於監測樣品-單一組連接設定,如正常導通接觸的 斷開或正常切斷接觸時不正確的導通(見圖310-1)。測試電路A不應指定測試樣品其 功能包含低等級或微電路等級(10mA或更低和2V或切斷時間或導通時間比10s更低 )；因為在測試情況下從測試電路電流穿過電子觸點可能造成電弧,從而損壞接觸 觸點
9、。2.1.2 Selection of test-circuit B. Test-circuit B is for monitoring test-specimens with a single set of contacts, for the opening of normally-closed contacts and false closures of normally- open contacts (see figure 310-3). Test-circuit B should not be used for openings or closings of less than 10
10、microseconds. Test-circuit B does not allow current in excess of 20 milliamperes or an open-circuit voltage in excess of 2-volts during monitoring; which insures that there will be no arcing, which will cause damage, to low-level and dry-circuit test specimens.2.1.2 選擇測試電路B。測試電路B是對於監控測試樣品-一組接點設定,如正常
11、導通接觸 的斷開或正常切斷接觸時不正確的導通(見圖310-3)。測試電路B不應使用於切斷或 導通時間低於10s的開關。測試電路B不允許測試電流超過20 m A或 或在監測期間 開路電壓超過2V; 在測試低等級和微電流的樣品期間,應保證樣品沒有電弧和造成損害 發生。 註: A-低於切換時間10s ,B-不應低於切斷或導通時間低於10s。3. TEST SYSTEMS.3.測試系統3.1 Test-circuit A. The test circuit shall be the thyratron circuit shown on figure 310-1 or an approved equiv
12、alent circuit. The values for R1, C1, and the suppressor grid-cathode voltage, controlled by R7, principally controls the firing of the thyratron and are so chosen that the thyratron will fire when the duration of the contact-opening exceeds the time-duration specified in the individual specificatio
13、n (see 4.3 and 5). For the longer time-durations, such as above 1 millisecond, it may be necessary to change the values of R2, R5, and R6.3.1測試電路A。測試電路應如圖310-1所示的閘流管電路或適當等效電路。R1,C1和抑制 柵極電壓值由R7來作控制,主要是在控制閘流管的觸發和當接觸斷開超過在特定規 格指定的時間期間,閘流管將改變觸發(見4.3章和5章)。對於較長的持續時間,如1ms 以上,它需要改變R2,R5和R6的阻值。a. To monitor n
14、ormally-closed contacts, the normally-closed contacts are connected to BP1 and BP2, with switch S1 in the normally-closed position. The grid of the thyratron is placed at ground potential. The cathode of the thyratron is at a positive potential (depending on the setting of R7), thus providing suffic
15、ient negative bias to cut the thyratron off. Any contact chatter (opening of closed contacts) will cause the grid of the thyratron to rise exponentially to +150 volts at a rate determined by the preselected time constant of R1 and C1. As long as the contacts remain open, the grid potential will continue to rise. If the contacts remain open for longer than the specified interval, the grid potential rises to the point at
